{"id":1096,"date":"2019-04-25T15:48:58","date_gmt":"2019-04-25T18:48:58","guid":{"rendered":"http:\/\/cdmf.org.br\/spimf2019\/?p=1096"},"modified":"2020-01-29T15:36:49","modified_gmt":"2020-01-29T18:36:49","slug":"espectroscopia-de-aniquilacion-de-positrones-una-herramienta-para-la-caracterizacion-de-defectos-tipo-vacancia-en-oxidos-semiconductores","status":"publish","type":"post","link":"http:\/\/cdmf.org.br\/spimf2019\/espectroscopia-de-aniquilacion-de-positrones-una-herramienta-para-la-caracterizacion-de-defectos-tipo-vacancia-en-oxidos-semiconductores\/","title":{"rendered":"Espectroscop\u00eda de aniquilaci\u00f3n de positrones: Una herramienta para la caracterizacion de defectos tipo-vacancia en \u00f3xidos semiconductores"},"content":{"rendered":"<ul>\n<li>\n<h3><a href=\"http:\/\/cdmf.org.br\/spimf\/speakers\/prof-dr-carlos-eugenio-macchi\/\">Prof. Dr.\u00a0Carlos Eugenio Macchi<\/a><\/h3>\n<ul>\n<li>\n<h5>IFIMAT and CIFICEN (UNCPBA-CICPBA-CONICET), Pinto 399, Tandil, Argentina<\/h5>\n<\/li>\n<li>\n<h5>Consejo Nacional de Investigaciones Cient\u00edficas y T\u00e9cnicas (CONICET), Argentina<\/h5>\n<\/li>\n<li>\n<h5>Comisi\u00f3n de Investigaciones Cient\u00edficas de la Provincia de Buenos Aires, Argentina<\/h5>\n<\/li>\n<\/ul>\n<\/li>\n<\/ul>\n<p style=\"text-align: justify;\">La espectroscop\u00eda de aniquilaci\u00f3n de positrones (PAS) ha demostrado ser una poderosa herramienta para el estudio de defectos en s\u00f3lidos ya que posee caracter\u00edsticas \u00fanicas debido a su alta sensibilidad para detectar defectos de tama\u00f1o at\u00f3mico\/nanom\u00e9trico tales como vacancias, aglomerados de vacancias o voids. Asimismo, PAS posibilita identificar y caracterizar cada uno de los defectos mencionados. Espec\u00edficamente, en materiales tales como los \u00f3xidos met\u00e1licos semiconductores que tienen una amplia variedad de aplicaciones tecnol\u00f3gicas entre los que se destacan los sensores de estado s\u00f3lido de gases, las celdas combustibles y los dispositivos optoelectr\u00f3nicos los positrones pueden brindar, adem\u00e1s, informaci\u00f3n acerca del estado de carga de los defectos.<\/p>\n<p style=\"text-align: justify;\">Existen diferentes variantes experimentales de PAS que se utilizan para estudiar \u00f3xidos semiconductores: i) la espectrometr\u00eda temporal positr\u00f3nica que permite identificar y cuantificar los distintos tipos de defectos as\u00ed como su estado de carga; y ii) la espectroscop\u00eda de ensanchamiento Doppler que brinda informaci\u00f3n no solo sobre los defectos sino, tambi\u00e9n, sobre las especies at\u00f3micas que decoran los defectos (i.e.; entornos qu\u00edmicos).<\/p>\n<p style=\"text-align: justify;\">En esta charla se introducir\u00e1n aspectos b\u00e1sicos de la espectroscop\u00eda de aniquilaci\u00f3n de positrones y se brindar\u00e1n algunos ejemplos de las potencialidades de PAS para el estudio y caracterizaci\u00f3n de defectos en \u00f3xidos met\u00e1licos semiconductores tales como el ZnO o el SnO 2 que hemos llevado a cabo en nuestro Grupo; asimismo se presentar\u00e1n primeros resultados obtenidos acerca del estudio de defectos en sistemas nanoestructurados base-CeO 2 que se llevan adelante en colaboraci\u00f3n con el CDMF\/LIEC.<\/p>\n<div class=\"responsive-embed\"><iframe loading=\"lazy\" title=\"I SPIMF - Carlos Eugenio Macchi\" width=\"1168\" height=\"657\" src=\"https:\/\/www.youtube.com\/embed\/LRkLCKb_B44?start=70&#038;feature=oembed\" frameborder=\"0\" allow=\"accelerometer; autoplay; encrypted-media; gyroscope; picture-in-picture\" allowfullscreen><\/iframe><\/div>\n","protected":false},"excerpt":{"rendered":"<p>Prof. Dr.\u00a0Carlos Eugenio Macchi IFIMAT and CIFICEN (UNCPBA-CICPBA-CONICET), Pinto 399, Tandil, Argentina Consejo Nacional de Investigaciones Cient\u00edficas y T\u00e9cnicas (CONICET), Argentina Comisi\u00f3n de Investigaciones Cient\u00edficas&hellip;<\/p>\n<p><a href=\"http:\/\/cdmf.org.br\/spimf2019\/espectroscopia-de-aniquilacion-de-positrones-una-herramienta-para-la-caracterizacion-de-defectos-tipo-vacancia-en-oxidos-semiconductores\/\" class=\"read-more-link\"><span class=\"read-more-icon\"><\/span>Leia mais<\/a><\/p>\n","protected":false},"author":1,"featured_media":1250,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"video","meta":{"_exactmetrics_skip_tracking":false,"_exactmetrics_sitenote_active":false,"_exactmetrics_sitenote_note":"","_exactmetrics_sitenote_category":0,"footnotes":""},"categories":[27],"tags":[],"class_list":["post-1096","post","type-post","status-publish","format-video","has-post-thumbnail","hentry","category-palestras","post_format-post-format-video"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v24.2 - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>Espectroscop\u00eda de aniquilaci\u00f3n de positrones: Una herramienta para la caracterizacion de defectos tipo-vacancia en \u00f3xidos semiconductores - SPIMF 2019 | CDMF<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" 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de aniquilaci\u00f3n de positrones: Una herramienta para la caracterizacion de defectos tipo-vacancia en \u00f3xidos semiconductores\",\"datePublished\":\"2019-04-25T18:48:58+00:00\",\"dateModified\":\"2020-01-29T18:36:49+00:00\",\"mainEntityOfPage\":{\"@id\":\"http:\/\/cdmf.org.br\/spimf2019\/espectroscopia-de-aniquilacion-de-positrones-una-herramienta-para-la-caracterizacion-de-defectos-tipo-vacancia-en-oxidos-semiconductores\/\"},\"wordCount\":340,\"publisher\":{\"@id\":\"http:\/\/cdmf.org.br\/spimf2019\/#organization\"},\"image\":{\"@id\":\"http:\/\/cdmf.org.br\/spimf2019\/espectroscopia-de-aniquilacion-de-positrones-una-herramienta-para-la-caracterizacion-de-defectos-tipo-vacancia-en-oxidos-semiconductores\/#primaryimage\"},\"thumbnailUrl\":\"http:\/\/cdmf.org.br\/spimf2019\/wp-content\/uploads\/2019\/07\/thumb-carlos-spimf.jpg\",\"articleSection\":[\"Palestras\"],\"inLanguage\":\"pt-BR\"},{\"@type\":\"WebPage\",\"@id\":\"http:\/\/cdmf.org.br\/spimf2019\/espectroscopia-de-aniquilacion-de-positrones-una-herramienta-para-la-caracterizacion-de-defectos-tipo-vacancia-en-oxidos-semiconductores\/\",\"url\":\"http:\/\/cdmf.org.br\/spimf2019\/espectroscopia-de-aniquilacion-de-positrones-una-herramienta-para-la-caracterizacion-de-defectos-tipo-vacancia-en-oxidos-semiconductores\/\",\"name\":\"Espectroscop\u00eda de aniquilaci\u00f3n de positrones: Una herramienta para la caracterizacion de defectos tipo-vacancia en \u00f3xidos semiconductores - SPIMF 2019 | CDMF\",\"isPartOf\":{\"@id\":\"http:\/\/cdmf.org.br\/spimf2019\/#website\"},\"primaryImageOfPage\":{\"@id\":\"http:\/\/cdmf.org.br\/spimf2019\/espectroscopia-de-aniquilacion-de-positrones-una-herramienta-para-la-caracterizacion-de-defectos-tipo-vacancia-en-oxidos-semiconductores\/#primaryimage\"},\"image\":{\"@id\":\"http:\/\/cdmf.org.br\/spimf2019\/espectroscopia-de-aniquilacion-de-positrones-una-herramienta-para-la-caracterizacion-de-defectos-tipo-vacancia-en-oxidos-semiconductores\/#primaryimage\"},\"thumbnailUrl\":\"http:\/\/cdmf.org.br\/spimf2019\/wp-content\/uploads\/2019\/07\/thumb-carlos-spimf.jpg\",\"datePublished\":\"2019-04-25T18:48:58+00:00\",\"dateModified\":\"2020-01-29T18:36:49+00:00\",\"breadcrumb\":{\"@id\":\"http:\/\/cdmf.org.br\/spimf2019\/espectroscopia-de-aniquilacion-de-positrones-una-herramienta-para-la-caracterizacion-de-defectos-tipo-vacancia-en-oxidos-semiconductores\/#breadcrumb\"},\"inLanguage\":\"pt-BR\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"http:\/\/cdmf.org.br\/spimf2019\/espectroscopia-de-aniquilacion-de-positrones-una-herramienta-para-la-caracterizacion-de-defectos-tipo-vacancia-en-oxidos-semiconductores\/\"]}]},{\"@type\":\"ImageObject\",\"inLanguage\":\"pt-BR\",\"@id\":\"http:\/\/cdmf.org.br\/spimf2019\/espectroscopia-de-aniquilacion-de-positrones-una-herramienta-para-la-caracterizacion-de-defectos-tipo-vacancia-en-oxidos-semiconductores\/#primaryimage\",\"url\":\"http:\/\/cdmf.org.br\/spimf2019\/wp-content\/uploads\/2019\/07\/thumb-carlos-spimf.jpg\",\"contentUrl\":\"http:\/\/cdmf.org.br\/spimf2019\/wp-content\/uploads\/2019\/07\/thumb-carlos-spimf.jpg\",\"width\":1280,\"height\":720},{\"@type\":\"BreadcrumbList\",\"@id\":\"http:\/\/cdmf.org.br\/spimf2019\/espectroscopia-de-aniquilacion-de-positrones-una-herramienta-para-la-caracterizacion-de-defectos-tipo-vacancia-en-oxidos-semiconductores\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"In\u00edcio\",\"item\":\"http:\/\/cdmf.org.br\/spimf2019\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Espectroscop\u00eda de aniquilaci\u00f3n de positrones: Una herramienta para la caracterizacion de defectos tipo-vacancia en \u00f3xidos semiconductores\"}]},{\"@type\":\"WebSite\",\"@id\":\"http:\/\/cdmf.org.br\/spimf2019\/#website\",\"url\":\"http:\/\/cdmf.org.br\/spimf2019\/\",\"name\":\"SPIMF | CDMF 2019\",\"description\":\"Simp\u00f3sio de Pesquisa e Inova\u00e7\u00e3o em Materiais Funcionais | CEPID-FAPESP\",\"publisher\":{\"@id\":\"http:\/\/cdmf.org.br\/spimf2019\/#organization\"},\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"http:\/\/cdmf.org.br\/spimf2019\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"pt-BR\"},{\"@type\":\"Organization\",\"@id\":\"http:\/\/cdmf.org.br\/spimf2019\/#organization\",\"name\":\"CDMF-CEPID\",\"url\":\"http:\/\/cdmf.org.br\/spimf2019\/\",\"logo\":{\"@type\":\"ImageObject\",\"inLanguage\":\"pt-BR\",\"@id\":\"http:\/\/cdmf.org.br\/spimf2019\/#\/schema\/logo\/image\/\",\"url\":\"http:\/\/cdmf.org.br\/spimf2019\/wp-content\/uploads\/2019\/02\/cdmf-logo.png\",\"contentUrl\":\"http:\/\/cdmf.org.br\/spimf2019\/wp-content\/uploads\/2019\/02\/cdmf-logo.png\",\"width\":200,\"height\":90,\"caption\":\"CDMF-CEPID\"},\"image\":{\"@id\":\"http:\/\/cdmf.org.br\/spimf2019\/#\/schema\/logo\/image\/\"},\"sameAs\":[\"https:\/\/www.facebook.com\/CDMFCEPID\/\",\"https:\/\/x.com\/CDMF_comunica\",\"https:\/\/www.instagram.com\/cdmf_fapesp\/\",\"https:\/\/www.linkedin.com\/company\/cdmf-cepid\/\",\"https:\/\/www.youtube.com\/channel\/UC3F0dJH6jQgFUC66RLxfetg\"]},{\"@type\":\"Person\",\"@id\":\"http:\/\/cdmf.org.br\/spimf2019\/#\/schema\/person\/558840b23434e60688abd3dfaaf6081c\",\"name\":\"LAbI\",\"image\":{\"@type\":\"ImageObject\",\"inLanguage\":\"pt-BR\",\"@id\":\"http:\/\/cdmf.org.br\/spimf2019\/#\/schema\/person\/image\/\",\"url\":\"https:\/\/secure.gravatar.com\/avatar\/12a7eca69d80041ba1ec4d8a982f14f38d7ebc5ec1d6e844decf3c74fc0f27bb?s=96&d=mm&r=g\",\"contentUrl\":\"https:\/\/secure.gravatar.com\/avatar\/12a7eca69d80041ba1ec4d8a982f14f38d7ebc5ec1d6e844decf3c74fc0f27bb?s=96&d=mm&r=g\",\"caption\":\"LAbI\"}}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"Espectroscop\u00eda de aniquilaci\u00f3n de positrones: Una herramienta para la caracterizacion de defectos tipo-vacancia en \u00f3xidos semiconductores - SPIMF 2019 | CDMF","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"http:\/\/cdmf.org.br\/spimf2019\/espectroscopia-de-aniquilacion-de-positrones-una-herramienta-para-la-caracterizacion-de-defectos-tipo-vacancia-en-oxidos-semiconductores\/","og_locale":"pt_BR","og_type":"article","og_title":"Espectroscop\u00eda de aniquilaci\u00f3n de positrones: Una herramienta para la caracterizacion de defectos tipo-vacancia en \u00f3xidos semiconductores - SPIMF 2019 | CDMF","og_description":"Prof. Dr.\u00a0Carlos Eugenio Macchi IFIMAT and CIFICEN (UNCPBA-CICPBA-CONICET), Pinto 399, Tandil, Argentina Consejo Nacional de Investigaciones Cient\u00edficas y T\u00e9cnicas (CONICET), Argentina Comisi\u00f3n de Investigaciones Cient\u00edficas&hellip;Leia mais","og_url":"http:\/\/cdmf.org.br\/spimf2019\/espectroscopia-de-aniquilacion-de-positrones-una-herramienta-para-la-caracterizacion-de-defectos-tipo-vacancia-en-oxidos-semiconductores\/","og_site_name":"SPIMF 2019 | CDMF","article_publisher":"https:\/\/www.facebook.com\/CDMFCEPID\/","article_published_time":"2019-04-25T18:48:58+00:00","article_modified_time":"2020-01-29T18:36:49+00:00","og_image":[{"width":1280,"height":720,"url":"http:\/\/cdmf.org.br\/spimf2019\/wp-content\/uploads\/2019\/07\/thumb-carlos-spimf.jpg","type":"image\/jpeg"}],"author":"LAbI","twitter_card":"summary_large_image","twitter_creator":"@CDMF_comunica","twitter_site":"@CDMF_comunica","twitter_misc":{"Escrito por":"LAbI","Est. tempo de leitura":"2 minutos"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"Article","@id":"http:\/\/cdmf.org.br\/spimf2019\/espectroscopia-de-aniquilacion-de-positrones-una-herramienta-para-la-caracterizacion-de-defectos-tipo-vacancia-en-oxidos-semiconductores\/#article","isPartOf":{"@id":"http:\/\/cdmf.org.br\/spimf2019\/espectroscopia-de-aniquilacion-de-positrones-una-herramienta-para-la-caracterizacion-de-defectos-tipo-vacancia-en-oxidos-semiconductores\/"},"author":{"name":"LAbI","@id":"http:\/\/cdmf.org.br\/spimf2019\/#\/schema\/person\/558840b23434e60688abd3dfaaf6081c"},"headline":"Espectroscop\u00eda de aniquilaci\u00f3n de positrones: Una herramienta para la caracterizacion de defectos tipo-vacancia en \u00f3xidos semiconductores","datePublished":"2019-04-25T18:48:58+00:00","dateModified":"2020-01-29T18:36:49+00:00","mainEntityOfPage":{"@id":"http:\/\/cdmf.org.br\/spimf2019\/espectroscopia-de-aniquilacion-de-positrones-una-herramienta-para-la-caracterizacion-de-defectos-tipo-vacancia-en-oxidos-semiconductores\/"},"wordCount":340,"publisher":{"@id":"http:\/\/cdmf.org.br\/spimf2019\/#organization"},"image":{"@id":"http:\/\/cdmf.org.br\/spimf2019\/espectroscopia-de-aniquilacion-de-positrones-una-herramienta-para-la-caracterizacion-de-defectos-tipo-vacancia-en-oxidos-semiconductores\/#primaryimage"},"thumbnailUrl":"http:\/\/cdmf.org.br\/spimf2019\/wp-content\/uploads\/2019\/07\/thumb-carlos-spimf.jpg","articleSection":["Palestras"],"inLanguage":"pt-BR"},{"@type":"WebPage","@id":"http:\/\/cdmf.org.br\/spimf2019\/espectroscopia-de-aniquilacion-de-positrones-una-herramienta-para-la-caracterizacion-de-defectos-tipo-vacancia-en-oxidos-semiconductores\/","url":"http:\/\/cdmf.org.br\/spimf2019\/espectroscopia-de-aniquilacion-de-positrones-una-herramienta-para-la-caracterizacion-de-defectos-tipo-vacancia-en-oxidos-semiconductores\/","name":"Espectroscop\u00eda de aniquilaci\u00f3n de positrones: Una herramienta para la caracterizacion de defectos tipo-vacancia en \u00f3xidos semiconductores - SPIMF 2019 | CDMF","isPartOf":{"@id":"http:\/\/cdmf.org.br\/spimf2019\/#website"},"primaryImageOfPage":{"@id":"http:\/\/cdmf.org.br\/spimf2019\/espectroscopia-de-aniquilacion-de-positrones-una-herramienta-para-la-caracterizacion-de-defectos-tipo-vacancia-en-oxidos-semiconductores\/#primaryimage"},"image":{"@id":"http:\/\/cdmf.org.br\/spimf2019\/espectroscopia-de-aniquilacion-de-positrones-una-herramienta-para-la-caracterizacion-de-defectos-tipo-vacancia-en-oxidos-semiconductores\/#primaryimage"},"thumbnailUrl":"http:\/\/cdmf.org.br\/spimf2019\/wp-content\/uploads\/2019\/07\/thumb-carlos-spimf.jpg","datePublished":"2019-04-25T18:48:58+00:00","dateModified":"2020-01-29T18:36:49+00:00","breadcrumb":{"@id":"http:\/\/cdmf.org.br\/spimf2019\/espectroscopia-de-aniquilacion-de-positrones-una-herramienta-para-la-caracterizacion-de-defectos-tipo-vacancia-en-oxidos-semiconductores\/#breadcrumb"},"inLanguage":"pt-BR","potentialAction":[{"@type":"ReadAction","target":["http:\/\/cdmf.org.br\/spimf2019\/espectroscopia-de-aniquilacion-de-positrones-una-herramienta-para-la-caracterizacion-de-defectos-tipo-vacancia-en-oxidos-semiconductores\/"]}]},{"@type":"ImageObject","inLanguage":"pt-BR","@id":"http:\/\/cdmf.org.br\/spimf2019\/espectroscopia-de-aniquilacion-de-positrones-una-herramienta-para-la-caracterizacion-de-defectos-tipo-vacancia-en-oxidos-semiconductores\/#primaryimage","url":"http:\/\/cdmf.org.br\/spimf2019\/wp-content\/uploads\/2019\/07\/thumb-carlos-spimf.jpg","contentUrl":"http:\/\/cdmf.org.br\/spimf2019\/wp-content\/uploads\/2019\/07\/thumb-carlos-spimf.jpg","width":1280,"height":720},{"@type":"BreadcrumbList","@id":"http:\/\/cdmf.org.br\/spimf2019\/espectroscopia-de-aniquilacion-de-positrones-una-herramienta-para-la-caracterizacion-de-defectos-tipo-vacancia-en-oxidos-semiconductores\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"In\u00edcio","item":"http:\/\/cdmf.org.br\/spimf2019\/"},{"@type":"ListItem","position":2,"name":"Espectroscop\u00eda de aniquilaci\u00f3n de positrones: Una herramienta para la caracterizacion de defectos tipo-vacancia en \u00f3xidos semiconductores"}]},{"@type":"WebSite","@id":"http:\/\/cdmf.org.br\/spimf2019\/#website","url":"http:\/\/cdmf.org.br\/spimf2019\/","name":"SPIMF | CDMF 2019","description":"Simp\u00f3sio de Pesquisa e Inova\u00e7\u00e3o em Materiais Funcionais | CEPID-FAPESP","publisher":{"@id":"http:\/\/cdmf.org.br\/spimf2019\/#organization"},"potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"http:\/\/cdmf.org.br\/spimf2019\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"pt-BR"},{"@type":"Organization","@id":"http:\/\/cdmf.org.br\/spimf2019\/#organization","name":"CDMF-CEPID","url":"http:\/\/cdmf.org.br\/spimf2019\/","logo":{"@type":"ImageObject","inLanguage":"pt-BR","@id":"http:\/\/cdmf.org.br\/spimf2019\/#\/schema\/logo\/image\/","url":"http:\/\/cdmf.org.br\/spimf2019\/wp-content\/uploads\/2019\/02\/cdmf-logo.png","contentUrl":"http:\/\/cdmf.org.br\/spimf2019\/wp-content\/uploads\/2019\/02\/cdmf-logo.png","width":200,"height":90,"caption":"CDMF-CEPID"},"image":{"@id":"http:\/\/cdmf.org.br\/spimf2019\/#\/schema\/logo\/image\/"},"sameAs":["https:\/\/www.facebook.com\/CDMFCEPID\/","https:\/\/x.com\/CDMF_comunica","https:\/\/www.instagram.com\/cdmf_fapesp\/","https:\/\/www.linkedin.com\/company\/cdmf-cepid\/","https:\/\/www.youtube.com\/channel\/UC3F0dJH6jQgFUC66RLxfetg"]},{"@type":"Person","@id":"http:\/\/cdmf.org.br\/spimf2019\/#\/schema\/person\/558840b23434e60688abd3dfaaf6081c","name":"LAbI","image":{"@type":"ImageObject","inLanguage":"pt-BR","@id":"http:\/\/cdmf.org.br\/spimf2019\/#\/schema\/person\/image\/","url":"https:\/\/secure.gravatar.com\/avatar\/12a7eca69d80041ba1ec4d8a982f14f38d7ebc5ec1d6e844decf3c74fc0f27bb?s=96&d=mm&r=g","contentUrl":"https:\/\/secure.gravatar.com\/avatar\/12a7eca69d80041ba1ec4d8a982f14f38d7ebc5ec1d6e844decf3c74fc0f27bb?s=96&d=mm&r=g","caption":"LAbI"}}]}},"_links":{"self":[{"href":"http:\/\/cdmf.org.br\/spimf2019\/wp-json\/wp\/v2\/posts\/1096","targetHints":{"allow":["GET"]}}],"collection":[{"href":"http:\/\/cdmf.org.br\/spimf2019\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"http:\/\/cdmf.org.br\/spimf2019\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"http:\/\/cdmf.org.br\/spimf2019\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"http:\/\/cdmf.org.br\/spimf2019\/wp-json\/wp\/v2\/comments?post=1096"}],"version-history":[{"count":6,"href":"http:\/\/cdmf.org.br\/spimf2019\/wp-json\/wp\/v2\/posts\/1096\/revisions"}],"predecessor-version":[{"id":1371,"href":"http:\/\/cdmf.org.br\/spimf2019\/wp-json\/wp\/v2\/posts\/1096\/revisions\/1371"}],"wp:featuredmedia":[{"embeddable":true,"href":"http:\/\/cdmf.org.br\/spimf2019\/wp-json\/wp\/v2\/media\/1250"}],"wp:attachment":[{"href":"http:\/\/cdmf.org.br\/spimf2019\/wp-json\/wp\/v2\/media?parent=1096"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"http:\/\/cdmf.org.br\/spimf2019\/wp-json\/wp\/v2\/categories?post=1096"},{"taxonomy":"post_tag","embeddable":true,"href":"http:\/\/cdmf.org.br\/spimf2019\/wp-json\/wp\/v2\/tags?post=1096"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}