Pesquisa

Ciclo Semanal de seminários do CCMC com Wagner Correr

18 de maio de 2016 CDMF 0

On this third technical talk we will discuss some techniques on Scannig Probe Microscopy that can be hanful in characterisation of ceramics. Topography and roughness are routinely measured using Atomic Force Microscopy (AFM), nevertheless electric […]

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