Scaling like behaviour of resistivity observed in LaNiO3 thin films grown on SrTiO3 substrate by pulsed laser deposition

Abstract: We discuss the origin of the temperature dependence of resistivity. observed in highly oriented LaNiO3 thin films grown on SrTiO3 substrate by a pulsed laser deposition technique. All the experimental data are found to collapse into a single universal curve rho(T, d) proportional to [T/T-sf(d)](3/2) for the entire temperature interval (20 < K < T< 300 K) with T-sf(d) being the onset temperature for triggering a resonant scattering of conduction electrons by spin fluctuations in LaNiO3/SrTiO3 heterostructure.

Author(s): Sergeenkov, S; Cichetto, L; Zampieri, M; Longo, E; Araujo-Moreira, FM

JOURNAL OF PHYSICS-CONDENSED MATTER

DOI: 10.1088/0953-8984/27/48/485307