Anomalous temperature behavior of resistance in C1-xCox thin films grown by pulsed laser deposition technique
Abstract: We study the transport properties of C1−xCox th00in films (with x = 0.1, 0.15 and 0.2) grown on Si substrate by pulsed laser deposition technique. The results demonstrate some anomalous effects in the behavior of the measured resistance R(T,x). More specifically, for 0 < T < T∗ range (with T∗ ≃ 220 K), the resistance is shown to be well fitted by a small polaron hopping scenario with and a characteristic temperature (with T0(0) = 120 K). While for higher temperatures T∗ < T < TC(x), the resistance is found to be linearly dependent on spontaneous magnetization M(T,x), viz. RM(T,x)∝M(T,x), following the pattern dictated by electron scattering on cobalt atoms formed robust ferromagnetic structure with the Curie temperature TC(x) obeying a percolation like law with TC(xm) = 295 K and the maximum zero-temperature magnetization reaching per Co atom for xm = 0.2.
Author(s): Sergeenkov, S.; Cordova, C.; Cichetto, L., Jr.; et al.
Journal of Alloys and Compounds
Volume: 667 Pages: 18-22 Published: 2016
DOI: https://doi.org/10.1016/j.jallcom.2016.01.141
