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Artigo
Characterization of nanostructured material images using fractal descriptors
Writers: João B. Florindo, Mariana S. Sikora, Ernesto C. Pereira, Odemir M. Bruno Keywords: FEG images; Nanoscale materials; Pattern recognition; Fractal dimension; Fractal descriptors; Image analysis Abstract: This work presents a methodology to the morphology analysis and characterization […]