Writers: B. Parija; T.Badapanda; S.K.Rout; L.S.Cavalcante; S.Panigrahi; E.Longo; N.C. Batista; T.P.Sinha
Keywords: C. Electrical property; Rietveld refinement; Raman spectroscopy; Phase boundaries
Abstract: Lead-free solid solutions (1−x)Bi0.5Na0.5TiO3 (BNT)–xBaZr0.25Ti0.75O3 (BZT) (x=0, 0.01, 0.03, 0.05, and 0.07) were prepared by the solid state reaction method. X-ray diffraction (XRD) and Rietveld refinement analyses of 1−x(BNT)–x(BZT) solid solution ceramic were employed to study the structure of these systems. A morphotropic phase boundary (MPB) between rhombohedral and cubic structures occured at the composition x=0.05. Raman spectroscopy exhibited a splitting of the (TO3) mode at x=0.05 and confirmed the presence of MPB region. Scanning electron microcopy (SEM) images showed a change in the grain shape with the increase of BZT into the BNT matrix lattice. The temperature dependent dielectric study showed a gradual increase in dielectric constant up to x=0.05 and then decrease with further increase in BZT content. Maximum coercive field, remanent polarization and high piezoelectric constant were observed at x=0.05. Both the structural and electrical properties show that the solid solution has an MPB around x=0.05.
DOI: 10.1016/j.ceramint.2012.11.080
