Red shift and higher photoluminescence emission of CCTO thin films undergoing pressure treatment

Abstract: CCTO thin films were deposited on Pt(11 1)/Ti/SiO2/Si substrates using a chemical (polymeric precursor) and pressure method. Pressure effects on CCTO thin films were evaluated by X-ray diffraction (XRD), field emission scanning electron microscopy (FE-SEM) and optical properties which revealed that a pressure film (PF) is denser and more homogeneous than a chemical film (CF). Pressure also causes a decrease in the band gap and an increase in the photoluminescence (PL) emission of CCTO films which suggests that the pressure facilitates the displacement of Ti in the titanate clusters and the charge transference from TiO6 to [TiO5Vz 0], [TiO5Vz 0] to [CaO11Vz 0] and [TiO5Vz 0] to ½CuO4 x .

Author(s): Sequinel, T.; Garcia, I. G.; Tebcherani, S. M.; et al.

Journal of Alloys and Compounds

Volume: 583 Pages: 488-491 Published: 2014

DOI: https://doi.org/10.1016/j.jallcom.2013.08.210

PDF: Red shift and higher photoluminescence emission of CCTO thin films undergoing pressure treatment