Piezoresponse force microscopy characterization of rare-earth doped BiFeO3 thin films grown by the soft chemical method
Writers: C.R. Foschini; M.A. Ramirez; S.R. Simões; J.A. Varela; E. Longo; A.Z. Simões Keywords: A. Films; B. Interfaces; C. Dielectric properties; C. Ferroelectric properties Abstract: The multiferroic behavior with ion modification using rare-earth cations on […]