Writers: João B. Florindo, Mariana S. Sikora, Ernesto C. Pereira, Odemir M. Bruno
Keywords: FEG images; Nanoscale materials; Pattern recognition; Fractal dimension; Fractal descriptors; Image analysis
Abstract: This work presents a methodology to the morphology analysis and characterization of nanostructured material images acquired from FEG-SEM (Field Emission Gun-Scanning Electron Microscopy) technique. The metrics were extracted from the image texture (mathematical surface) by the volumetric fractal descriptors, a methodology based on the Bouligand–Minkowski fractal dimension, which considers the properties of the Minkowski dilation of the surface points. An experiment with galvanostatic anodic titanium oxide samples prepared in oxalyc acid solution using different conditions of applied current, oxalyc acid concentration and solution temperature was performed. The results demonstrate that the approach is capable of characterizing complex morphology characteristics such as those present in the anodic titanium oxide.
See PDF: Characterization of nanostructured material images using fractal descriptors
DOI: 10.1016/j.physa.2012.11.020
