On this third technical talk we will discuss some techniques on Scannig Probe Microscopy that can be hanful in characterisation of ceramics. Topography and roughness are routinely measured using Atomic Force Microscopy (AFM), nevertheless electric and magnetic properties can also be measured using several less known and equally useful techniques. We will discuss the measurement principle of AFM, KPM, EFM, and MFM, including examples from the published literature.
Seminarista: Wagner Rafael Correr
Data e horário: Dia 19/05/2016, quinta feira, das 10h às 11h
Local: Sala 14, Prédio Administrativo do IFSC (embaixo do anfiteatro Prof. Sérgio Mascarenhas)
