A study approach on ferroelectric domains in BaTiO3

Materials Characterization Volume: 120 Pages: 257-262 Published: 2016

AFAM images below (a) and above (b) the resonance frequency. AFAM image while/during poling (c). Piezoresponse (magnitude signal mapping) image (d) while poling using various DC bias voltages ranging from −10 V to +10 V at different durations and line profile during poling (e).

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Writers: L.S.R. Rocha and C.S. Cavalcanti and R.A.C. Amoresi and B.D. Stojanovic and E. Borsari and M.A. Zaghete and A.Z. Simões

Keywords: Ceramics; Crystal growth; Piezoelectricity

Abstract: Atomic Force Acoustic Microscopy (AFAM) and Piezoresponse Force Microscopy (PFM) were used to study local elastic and electromechanical response in BaTiO3 ceramics. A commercial multi-mode Scanning Probe Microscopy (SPM) and AFAM mode to image contact stiffness were employed to accomplish the aforementioned purposes. Stiffness parameters along with Young’s moduli and piezo coefficients were quantitatively determined. PFM studies were based on electrostatic and electromechanical response from localized tip-surface contact. Comparison was made regarding the Young’s moduli obtained by AFAM and PFM. In addition, phase and amplitude images were analyzed based on poling behavior, obtained via the application of − 10 V to + 10 V local voltage.

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