Scaling like behaviour of resistivity observed in LaNiO3 thin films grown on SrTiO3 substrate by pulsed laser deposition

JOURNAL OF PHYSICS-CONDENSED MATTER

12 de abril de 2019 LAbI UFSCar Artigo 0

Scaling like behaviour of resistivity observed in LaNiO3 thin films grown on SrTiO3 substrate by pulsed laser deposition

Abstract: We discuss the origin of the temperature dependence of resistivity. observed in highly oriented LaNiO3 thin films grown on SrTiO3 substrate by a pulsed laser deposition technique. All the experimental data are found to collapse into a single universal curve rho(T, d) proportional to [T/T-sf(d)](3/2) for the entire temperature interval (20 < K < T< 300 K) with T-sf(d) being the onset temperature for triggering a resonant scattering of conduction electrons by spin fluctuations in LaNiO3/SrTiO3 heterostructure.

Author(s): Sergeenkov, S; Cichetto, L; Zampieri, M; Longo, E; Araujo-Moreira, FM

JOURNAL OF PHYSICS-CONDENSED MATTER

Volume: 27 Published: DEC 9 2015

PDF: Scaling like behaviour of resistivity observed in LaNiO3 thin films grown on SrTiO3 substrate by pulsed laser deposition

DOI: 10.1088/0953-8984/27/48/485307

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O Laboratório Aberto de Interatividade para Disseminação do Conhecimento Científico e Tecnológico (LAbI), vinculado à Universidade Federal de São Carlos (UFSCar), é voltado à prática da divulgação científica pautada na interatividade; nas relações entre Ciência, Arte e Tecnologia.
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