Morphotropic phase boundary and electrical properties of 1−x[Bi0.5Na0.5]TiO3 –xBa[Zr0.25Ti0.75]O3 lead-free piezoelectric ceramics

Ceramics International Volume: 39 Issue: 5 Pages: 4877-4886 Published: 2013

SEM image for 1−x(Bi0.5Na0.5)TiO3−xBa[Zr0.25Ti0.75]O3 ceramics with x=0 (a); x=0.01 (b); x=0.03 (c); x=0.05 (d); and x=0.07 (e).

Writers: B. Parija; T.Badapanda; S.K.Rout; L.S.Cavalcante; S.Panigrahi; E.Longo; N.C. Batista; T.P.Sinha

Keywords: C. Electrical property; Rietveld refinement; Raman spectroscopy; Phase boundaries

Abstract: Lead-free solid solutions (1−x)Bi0.5Na0.5TiO3 (BNT)–xBaZr0.25Ti0.75O3 (BZT) (x=0, 0.01, 0.03, 0.05, and 0.07) were prepared by the solid state reaction method. X-ray diffraction (XRD) and Rietveld refinement analyses of 1−x(BNT)–x(BZT) solid solution ceramic were employed to study the structure of these systems. A morphotropic phase boundary (MPB) between rhombohedral and cubic structures occured at the composition x=0.05. Raman spectroscopy exhibited a splitting of the (TO3) mode at x=0.05 and confirmed the presence of MPB region. Scanning electron microcopy (SEM) images showed a change in the grain shape with the increase of BZT into the BNT matrix lattice. The temperature dependent dielectric study showed a gradual increase in dielectric constant up to x=0.05 and then decrease with further increase in BZT content. Maximum coercive field, remanent polarization and high piezoelectric constant were observed at x=0.05. Both the structural and electrical properties show that the solid solution has an MPB around x=0.05.

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DOI: 10.1016/j.ceramint.2012.11.080

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