Magnetic characteristics of nanocrystalline GaMnN films deposited by reactive sputtering

Solid State Sciences Volume: 17 Pages: 97-101 Published: 2013

Experimental magnetization curves (open circles) for x = 0.08 taken at (a) 2 K and (b) 5 K, and for x = 0.18 taken at (c) 2 K and (d) 10 K. The red solid lines are the best fits to the experimental data using Brillouin functions. The contributing curves (M1: blue dash-dotted lines, M2: orange dotted lines, M3: green dashed lines) were also plotted in each graph. (For interpretation of the references to colour in this figure legend, the reader is referred to the web version of this article.)

Writers: D.M.G. Leite; A.L.J. Pereira; W.A. Iwamoto; P.G. Pagliuso; P.N. Lisboa-Filho; J.H.D. da Silva

Keywords: Sputtering; GaMnN; Nanocrystalline material; Diluted magnetic semiconductor; Magnetic properties

Abstract: The magnetic characteristics of Ga1−xMnxN nanocrystalline films (x = 0.08 and x = 0.18), grown by reactive sputtering onto amorphous silica substrates (a-SiO2), are shown. Further than the dominant paramagnetic-like behaviour, both field- and temperature-dependent magnetization curves presented some particular features indicating the presence of secondary magnetic phases. A simple and qualitative analysis based on the Brillouin function assisted the interpretation of these secondary magnetic contributions, which were tentatively attributed to antiferromagnetic and ferromagnetic phases.

See PDF: Magnetic characteristics of nanocrystalline GaMnN films deposited by reactive sputtering

DOI: 10.1016/j.solidstatesciences.2012.11.020

Sobre CDMF 591 Artigos
O CDMF é um dos Centros de Pesquisa, Inovação e Difusão (CEPID) apoiados pela FAPESP. O Centro também recebe investimento do CNPq, a partir do Instituto Nacional de Ciência e Tecnologia dos Materiais em Nanotecnologia (INCTMN).