
Degradation Analysis of the SnO2 and ZnO-Based Varistors Using Electrostatic Force Microscopy
Writers: M. A. Ramırez, R. Tararam, A. Z. Simoes, A. Ries, E. Longo, J. A. Varela Keywords: Varistors; Microscopy; method Abstract: The degradation phenomena of ZnO and SnO2-based varistors were investigated for two different degradation methods: DC voltage at increased […]